Xác định sự phân bố ứng suất dư theo chiều sâu bằng phương pháp cắt lớp

NGHISN cCru-TRAO D6 I

XAC DINH SU PHAN B 6 UNG SUAT DU THEO CHI^U SAU

BANG PHUONG PHAP CAT LOP

DETERMINATION OF IN-DEPTH RESIDUAL STRESS DISTRIBUTION BY LAYER

REMOVAL METHOD

Tran Minh Tiln, Le Chi Cmmg

Truong Dai hoc Su phjm Ky thuat TP. H6 Chi Minh

T6M TAT

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ABSTRACT

Residual stress in the surface layer of crystalline materials may cause deformation or damage of

materials, determination of residual stress plays an important role in treatment and improvement

process of the working conditions of machine components. This paper will present the technique

using layer removal method lo determine the residual stress distribution through the thickness ofihe

specimen. The appropriate method uses for removing layer that does not introduce Ihe new residual

stress in the surface layer ofihe specimen is the eleetropolishing technique. Ttie residual stress in

the surface ofihe specimen is measured by X-ray diffraction for removing layer. Determination of

the in-depth residual stress distribution was carried out on steel €45 specimen. The result shows

that the residual stress distribution is the inhomogeneous in the direction of the thickness.

Keywords: Residual stress. Layer removal method. X-ray diffraction, Eleetropolishing.

1. GIOI THIfU nhi?t, hojc gia cong co. ITng suit du la nguyen

nhan gay ra phd hiiy chi tilt vJ c6 inh hudng

Ung suat du U Uang thai ung suit ton tnre tilp din dp bin moi cua chi till,

tai phan Ion ben trong vat li^u khi khong c6 tac

dung cua ngojii luc. lfng suit du co thi phit Nhilu phuong phap da dugc phit triln

sinh trong hau hit qua trinh san xuit nhu xii ly dl xic dinh umg suit du, chiing dugc chia lam

ISSN 0866-7056

TAP CHf CO KHl VI£T NAM, S6 8 nam 2016