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E 175 82 (2010)
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Designation: E175 − 82 (Reapproved 2010)
Standard Terminology of
Microscopy1
This standard is issued under the fixed designation E175; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
Abbe condenser—see condenser, Abbe.
aberration—any error that results in image degradation. Such
errors may be chromatic, spherical, astigmatic, comatic,
distortion, or curvature of field; and can result from design or
execution, or both.
achromatic—literally, color-free. A lens or prism is said to be
achromatic when corrected for two colors. The remaining
color seen in an image formed by such a lens is said to be
secondary chromatic aberration.
achromatic objective—an objective that is corrected chromatically for two colors, and spherically for one, usually in
the yellow-green part of the spectrum.
Airy disk—the image of a bright point object, as focused by a
lens system. With monochromatic light, it consists of a
central point of maximum intensity surrounded by alternate
circles of light and darkness caused by the reinforcement and
interference of diffracted rays. The light areas are called
maxima and the dark areas minima. The distribution of light
from the center to the outer areas of the figure was
investigated mathematically by Sir George Airy. The diffraction disk forms a basis for determining the resolving power
of an ideal lens system. The diameter of the disk depends
largely on the aperture of the lens. The diffraction of light
causing the Airy disk is a factor limiting the resolution of a
well corrected optical system.
analyzer—an optical device, capable of producing plane
polarized light, used for detecting the state of polarization.
a˚ngström unit—a unit of linear measure named after A. J.
Ångström. It is 1 × 10−10 metres; 1 µm = 10,000 Å. It is
generally abbreviated as A. in the United States; elsewhere,
it is variously abbreviated Å , A., A.U., Å., or ÅU.
angular aperture—see aperture, angular.
aperture, angular—the angle between the most divergent rays
that can pass through a lens to form the image of an object.
aperture, effective—the diameter of the entrance pupil; it is
the apparent diameter of the limiting aperture measured from
the front.
aplanatic—corrected for spherical aberration and coma.
apochromatic objective—a lens system whose secondary
chromatic aberrations have been substantially reduced. (See
achromatic).
axis, optical—the line formed by the coinciding principal axes
of a series of optical elements comprising an optical system.
It is the line passing through the centers of curvature of the
optical surfaces.
axis, optic—the direction, or directions in an anisotropic
crystal along which light is not doubly refracted.
balsam, Canada—a resin from the balsam fir Abies balsamea.
Dissolved in xylene, toluene, or benzene it is used as a
mountant for permanent microscopical preparations. Its
refractive index may vary from 1.530 to 1.545 and its
softening point from room temperature to 100°C, these
properties varying with age and solvent content. If impure it
discolors with age.
Bertrand lens—see lens, Bertrand.
bisectrix, acute—in biaxial crystals, that principal axis of the
ellipsoid of indexes which bisects the smaller angle between
the optic axes.
bisectrix, obtuse—in biaxial crystals, that principal axis of the
ellipsoid of indexes which bisects the larger angle between
the optic axes.
calcite—a doubly refracting mineral used in the manufacture
of polarizing prisms. It is uniaxial negative and in the
trigonal diversion of the hexagonal system of crystals. Its
indexes are ´ = 1.486, v = 1.658; its hardness is 3 on the
Mohr scale and specific gravity 2.711.
Canada balsam—see balsam, Canada.
chromatic aberration—a defect in a lens or lens system as a
result of which the lens possesses different focal lengths for
radiation of different wavelengths.
1 This terminology is under the jurisdiction of ASTM Committee E04 on
Metallography and is the direct responsibility of Subcommittee E04.02 on Terminology
Current edition approved July 1, 2010 . Published July 2010. Originally approved
in 1961. Last previous edition approved in 2005 as E175 – 82 (2005). DOI:
10.1520/E0175-82R10.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
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